John Walko
EE Times Europe

Researchers at the National Institute of Standards and Technology in the U.S have warned of a fundamental flaw in the understanding of transistor noise, and suggest that unless it is solved, it could stand in the way of developing more efficient, lower powered devices.

The researchers, led by Jason Campbell, came across the problem while studying the fluctuations between on-off states in progressively smaller transistors.

They claim that a widely accepted model explaining errors caused by electronic 'noise' in switches does not fit the facts. For decades, they say, the engineering community has largely accepted a theoretical model that identifies these defects and helps guide efforts to mitigate them.

[Read More] [Comments ]