General
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Written by Gizmo
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Wednesday, 27 May 2009 10:15 |
John Walko
EE Times Europe
Researchers at the National Institute of Standards and Technology in
the U.S have warned of a fundamental flaw in the understanding of
transistor noise, and suggest that unless it is solved, it could stand
in the way of developing more efficient, lower powered devices.
The researchers, led by Jason Campbell, came across the problem
while studying the fluctuations between on-off states in progressively
smaller transistors.
They claim that a widely accepted model explaining errors
caused by electronic 'noise' in switches does not fit the facts. For
decades, they say, the engineering community has largely accepted a
theoretical model that identifies these defects and helps guide efforts
to mitigate them.
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